Search results
Journal of Electronic Testing > 2018 > 34 > 6 > 735-747
IEEE Transactions on Nuclear Science > 2017 > 64 > 5 > 1142 - 1150
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 89 - 96
IEEE Transactions on Nuclear Science > 2016 > 63 > 6 > 2950 - 2961
IEEE Transactions on Computers > 2016 > 65 > 2 > 382 - 395
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2666 - 2672
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 3040 - 3048
IEEE Transactions on Nuclear Science > 2013 > 60 > 3-3 > 2272 - 2279
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 3076 - 3084
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 2119 - 2123
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3109 - 3114
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3408 - 3414
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3469 - 3476
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 203 - 209
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2100 - 2105