Search results
International Journal of Circuit Theory and Applications > 52 > 6 > 2956 - 2970
Chemical Physics Letters > 2018 > 706 > C > 380-382
Journal of Molecular Modeling > 2017 > 23 > 12 > 1-9
Microelectronics Reliability > 2017 > 76-77 > C > 692-697
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2250 - 2256
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2622 - 2633
Microelectronics Reliability > 2015 > 55 > 9-10 > 1486-1490
2015 IEEE International Reliability Physics Symposium > 2C.3.1 - 2C.3.5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 4 > 743 - 751
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1597 - 1602
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1575 - 1582