Search results for: Marise Bafleur
IEEE Transactions on Industrial Electronics > 2017 > 64 > 12 > 9646 - 9656
Microelectronics Reliability > 2017 > 76-77 > C > 692-697
2016 IEEE SENSORS > 1 - 3
IEEE Transactions on Power Electronics > 2015 > 30 > 6 > 3215 - 3227
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 432 - 440
IEEE Aerospace and Electronic Systems Magazine > 2014 > 29 > 8-1 > 18 - 22
Journal of Electronic Materials > 2014 > 43 > 6 > 2444-2451
IEEE Transactions on Electromagnetic Compatibility > 2013 > 55 > 1 > 45 - 57
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 599 - 606
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 607 - 614