Wyniki wyszukiwania
Journal of Electronic Testing > 2017 > 33 > 6 > 751-767
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2949 - 2961
IEEE Transactions on Emerging Topics in Computing > 2017 > 5 > 2 > 260 - 270
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1467 - 1476
IEEE Design & Test > 2016 > 33 > 6 > 7 - 14
IEEE Design & Test > 2016 > 33 > 6 > 38 - 45
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 11 > 1903 - 1913