The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Main objective of this study is to design and development of multi-die embedded micro wafer level packages (EMWLP) reliability test vehicles. Such as, the laterally placed die EMWLP and the vertically stacked thin die EMWLP. For reliability evaluation, EMWLPs have been subjected to both environmental and mechanical reliability tests as per JEDEC standards. These reliability tests include highly accelerated...
Stacked die package is a key technique to meet the requirements of smaller size and higher density of electronic products. Moisture plays an important role in the reliability of electronic devices, especially with high temperature, in which the major failures are from corrosion, delamination and crack. The delamination and crack make the device to be easily weak and sensitive to external environment...
Wire pull tests are generally conducted to assess the wire bonding quality. Using Cu/low-k technology, two failure modes are usually observed: Failure in the neck of the wire (neck break) and metal peel off (MPO). The objective of our study is to investigate the root cause of metal peel off by using a combined experimental and numerical approach. First, dedicated failure analyses are conducted to...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.