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IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 41 - 48
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 81 - 84
IEEE Journal of Selected Topics in Quantum Electronics > 2018 > 24 > 2 > 1 - 6
IEEE Electron Device Letters > 2018 > 39 > 1 > 131 - 134
IEEE Electron Device Letters > 2018 > 39 > 1 > 135 - 138
IEEE Electron Device Letters > 2018 > 39 > 1 > 127 - 130
IEEE Electron Device Letters > 2018 > 39 > 1 > 111 - 114
IEEE Design & Test > 2017 > 34 > 6 > 54 - 62
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3509 - 3520
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5230 - 5235
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5217 - 5222
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5284 - 5287
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5057 - 5064
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4937 - 4945
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 12 > 1362 - 1366
IEEE Electron Device Letters > 2017 > 38 > 12 > 1759 - 1762
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5093 - 5098
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-2 > 5203 - 5211
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 12 > 3115 - 3125