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IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4386 - 4392
2015 IEEE International Reliability Physics Symposium > 3A.4.1 - 3A.4.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 3A.5.1 - 3A.5.6
2011 International Reliability Physics Symposium > 5A.3.1 - 5A.3.5