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IEEE Journal of Solid-State Circuits > 2017 > 52 > 1 > 218 - 228
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3103 - 3108
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3264 - 3271
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2136 - 2144
2013 IEEE International Electron Devices Meeting > 30.5.1 - 30.5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.5.1 - MY.5.4
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3084 - 3090
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 2910 - 2916
IEEE Transactions on Electron Devices > 2011 > 58 > 12 > 4370 - 4376
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 924 - 930
2010 International Electron Devices Meeting > 29.2.1 - 29.2.4