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IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
2015 IEEE International Reliability Physics Symposium > 2E.2.1 - 2E.2.6
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
2015 IEEE International Reliability Physics Symposium > 2E.2.1 - 2E.2.6