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IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 45 - 50
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4868 - 4874
IEEE Electron Device Letters > 2017 > 38 > 10 > 1413 - 1416
IEEE Electron Device Letters > 2017 > 38 > 10 > 1445 - 1448
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4065 - 4070
2017 IEEE SENSORS > 1 - 3
IEEE Electron Device Letters > 2017 > 38 > 9 > 1298 - 1301
IEEE Electron Device Letters > 2017 > 38 > 9 > 1294 - 1297
IEEE Electron Device Letters > 2017 > 38 > 9 > 1305 - 1308
IEEE Electron Device Letters > 2017 > 38 > 8 > 1094 - 1096
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3114 - 3119
IEEE Electron Device Letters > 2017 > 38 > 6 > 771 - 774
IEEE Electron Device Letters > 2017 > 38 > 5 > 657 - 660
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-3.1 - 4B-3.6