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Journal of Electronic Testing > 2017 > 33 > 3 > 315-328
Integration, the VLSI Journal > 2016 > 55 > C > 415-424
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 8 > 1386 - 1395
Journal of Electronic Testing > 2017 > 33 > 3 > 315-328
Integration, the VLSI Journal > 2016 > 55 > C > 415-424
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 8 > 1386 - 1395