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IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4868 - 4874
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3634 - 3638
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-5.1 - 3B-5.5
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 824 - 831
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2284 - 2291
IEEE Photonics Technology Letters > 2016 > 28 > 24 > 2803 - 2806
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4702 - 4706
IEEE Transactions on Nanotechnology > 2016 > 15 > 6 > 947 - 955
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2831 - 2837
IEEE Transactions on Nuclear Science > 2016 > 63 > 3-3 > 1918 - 1926
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2346 - 2352
IEEE Electron Device Letters > 2016 > 37 > 3 > 310 - 313
IEEE Electron Device Letters > 2016 > 37 > 1 > 74 - 76
2015 IEEE International Electron Devices Meeting (IEDM) > 35.3.1 - 35.3.4
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1440 - 1447
IEEE Electron Device Letters > 2015 > 36 > 4 > 321 - 323