Search results
IEEE Electron Device Letters > 2017 > 38 > 10 > 1425 - 1428
IEEE Electron Device Letters > 2017 > 38 > 9 > 1298 - 1301
IEEE Sensors Letters > 2017 > 1 > 2 > 1 - 4
IEEE Electron Device Letters > 2017 > 38 > 3 > 371 - 374
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3451 - 3458
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3479 - 3486
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-5-1 - 4A-5-6
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 997 - 1004
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730
IEEE Electron Device Letters > 2015 > 36 > 11 > 1132 - 1134
IEEE Electron Device Letters > 2015 > 36 > 7 > 660 - 662
IEEE Electron Device Letters > 2015 > 36 > 4 > 375 - 377
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3365 - 3370
IEEE Electron Device Letters > 2013 > 34 > 2 > 214 - 216