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This paper will focus on the fast assessment methodology of FBGA fatigue life through simulation and physics of failure (PoF) analysis under thermal cycle. The structure of fine pitch ball grid array (FBGA) that has been investigated, and been modeled by ANSYS to compare with experimental data. There are two temperature cycling will be used, one is used to verify FEA model, and the other one is used...
This paper presents the result of verifying Miner's law of the solder joint part by mechanical fatigue tests and FEM analysis. The author's group have studied the Manson-Coffin's law for lead free solder joint by using the isothermal fatigue test and FEM analytical approaches to establish the practicable evaluation of thermal fatigue life of solder joints, for example, for the Sn-Cu solder, because...
A thermal reliability model is proposed for board level package-on-package (POP) assembling in this work, Design analysis is performed to study the effect of key package parameters such as die size, substrate size, solder ball size, etc. According to the finite elements analysis on the thermal reliability model, thermal distribution and thermal gratitude of the 3-dimension package is obtained within...
Analysis using ANSYS software, CSP component was reduced to two-dimensional model. In the thermal cyclic loading conditions using finite element simulating the stress and strain distribution of CSP components, obtained a dangerous solder joint of structural failure. The number of failure cycles about dangerous solder joint was predicted. Finally, introduced several analysis and evaluation method for...
In the last half a century, the complexity of electronic systems has undergone a sustainable rapid development stage following the Moore's law: the density of integrated circuits (ICs) was doubled every two years. As a result, electronic devices become more miniaturized in space and contain more power in unit volume. Electronic package has to deal with highly increased I/Os with fine soldering pitch...
Solder joints, which serve as mechanical, thermal and electrical interconnections between the electronic packages and the printed circuit board (PCB), are the most vulnerable part in a portable product when the product is subjected to mechanical loading. Therefore, a comprehensive study of mechanics behavior of solder joints is indispensable for understanding the reliability of portable electronic...
This article describes recent advance in research of reliability of lead-free (SAC 305) ball interconnections between electronic modules and base printed circuit boards. Alternative methods such as finite element method, which is being widely used in simulation software Ansys and by Coffin-Manson's fatigue model. Recent calculations concur to statistic-based evaluation of earlier experiments, which...
3D packaging is one of the main emerging markets especially for mobile application within the last view years. Mobile devices are exposed and hence need to be reliable under to vibration or mechanical shock conditions. Therefore, material properties covering strain rate dependency have to be at hand within reliability studies. Miniature bulk specimens were utilized to gain stress and strain data at...
In this decade, the Moore's law does not fit the trend of technological improvement any more. In order to keep the increasing rate of device density and I/O numbers, the size of devices shrink rapidly. In this kind of condition, the stack of integrated circuit (IC), which is also called three-dimensional integrated circuits (3-D ICs), is a preferable solution of the next-generation products. There...
In this paper, thick film chip resistors with two different types of solder alloys namely SnPb and SnAgCu have been evaluated for the effects of the solder alloy elemental composition on the solder joint failures under cyclic temperature loading conditions. The creep properties of both solders have been modelled using the Garofalo equation and the creep strain energy density has been extracted and...
Wafer level Chip Scale Package (WLCSP) fulfills the demand for small, light, and portable handheld electronic devices, and it is one of the most advanced packaging concepts. When the WLCSP was assembled on board level, the connection, i.e. solder joints are generally the critical and challenging issue for the whole device's reliability. In addition to the shape and material of solder joints, the material...
Prevalence of portable devices such as netbook led to increased concerns on drop reliability of FBGA. In order to investigate drop reliability, board level drop test according to Jedec is done in assembly and SMT company, whereas system drop test such as netbook drop test is processed in final product company. In general, the lifetime of Jedec board level drop test and the lifetime of system drop...
The purpose of this paper is to compare the ability of solder joint with different shape (hourglass-shaped, barrel-shaped and cylinder-shaped) to resist destruction under drop impact loadings. Three 3D finite element models of VFBGA (very-thin-profile fine-pitch BGA) packages, including different shape of solder joints, are established respectively. According to the condition B in the drop test standard...
In electronic product, reliability of solder joint has big impact on the function of the whole electronic product. In the design period of the package, it is important to predict solder joint thermal fatigue lifetime and analyze the effect of each factors on the lifetime of solder joint. Finite Element Analysis (FEA) based solder joint lifetime prediction method, which used Anand viscoplastic constitutive...
Along with more and more use of high density plastic ball grid array (PBGA) in portable electronic products and military electronic equipments, the vibration fatigue reliability of solder joints for PBGA becomes a critical concern. In this paper, a quarter 3D symmetric model was developed by ANSYS software, then modal analysis of PCBA assembly and random vibration response analysis of mixed solder...
In this paper, the investigation focuses on the copper stud bump solder joint thermal-mechanical reliability. The copper stud bump processing is simulated by FEM software Ansys/Ls-dyna, and then the relationship between the copper stud bump and processing parameters (bonding force, ultrasonic power, bonding time and bonding temperature) is studied. Based on the simulation result, the dimension of...
System-in-a-Package (SiP) aims to integrate a functional sub-system with one or more semiconductor chips along with passive components onto a substrate. SiP is transferred molded to the OEM for second level assembly using industry standards and high volume equipment. In most recent applications (high I/O density, improved electrical performance), LGA (Land Grid Array) is a very practical solution...
This study serves to validate the predictive finite element modeling approach for the solder joint thermal fatigue life analysis, with emphasis on the applicability to various lead-free solder joints. The three packages involved in the study are 8??8 mm PBGA, l0??l0 mm QFN, and 51??51 mm CBGA. They are designed to consist of SAC387, SAC305, ??SAC305 ball + SAC387 paste?? and ??SAC387 ball + SAC305...
This paper presents a method mining the worst thermal fatigue life of solder joints on chip components used in vehicle electronics. Thermal fatigue life of crack initiation and propagation were calculated by using the finite element method. Statistical analysis of thermal fatigue life in the solder layer below the chip component was carried out. A sample of dispersed fatigue lives was generated by...
This paper presents mining the worst thermal fatigue life of solder joints on chip components used in vehicle electronics. The authors proposed an isothermal fatigue test method using real size solder joints to get the fatigue properties. The Manson-Coffin's law given by this method could improve the agreement between the simulation model and experimental results. Based upon the Manson-Coffin's law...
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