Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3138 - 3151
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 10 > 1688 - 1701
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 8 > 1265 - 1273
IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 307 - 315
IEEE Electron Device Letters > 2017 > 38 > 4 > 430 - 433
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1455 - 1466
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 3 > 857 - 871
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 3 > 1012 - 1022
IEEE Transactions on Nuclear Science > 2017 > 64 > 2 > 852 - 858
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 512 - 518
IEEE Access > 2017 > 5 > 22194 - 22198
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2227 - 2234
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 597 - 603
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 522 - 531
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4279 - 4287
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 376 - 383
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 9 > 2993 - 2997
IEEE Design & Test > 2016 > 33 > 4 > 82 - 91
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3354 - 3359