Search results
IEEE Electron Device Letters > 2017 > 38 > 6 > 786 - 789
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1278 - 1283
IEEE Transactions on Nuclear Science > 2013 > 60 > 1-2 > 402 - 407
IEEE Electron Device Letters > 2013 > 34 > 2 > 151 - 153
IEEE Electron Device Letters > 2013 > 34 > 3 > 360 - 362
2012 International Electron Devices Meeting > 7.4.1 - 7.4.4
2012 International Electron Devices Meeting > 32.1.1 - 32.1.4
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.2.1 - GD.2.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 3D.4.1 - 3D.4.7
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1653 - 1660
IEEE Electron Device Letters > 2012 > 33 > 10 > 1366 - 1368
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2582 - 2588
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3651 - 3654
IEEE Electron Device Letters > 2012 > 33 > 9 > 1255 - 1257
IEEE Electron Device Letters > 2012 > 33 > 10 > 1339 - 1341
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2589 - 2596
IEEE Electron Device Letters > 2012 > 33 > 4 > 468 - 470