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IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Electron Device Letters > 2017 > 38 > 10 > 1441 - 1444
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-2.1 - 3B-2.8
IEEE Electron Device Letters > 2017 > 38 > 4 > 505 - 508
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1032 - 1037
IEEE Electron Device Letters > 2017 > 38 > 1 > 99 - 102
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 246 - 252
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3487 - 3492
2016 IEEE International Reliability Physics Symposium (IRPS) > CD-3-1 - CD-3-6
IEEE Electron Device Letters > 2016 > 37 > 4 > 385 - 388
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1486 - 1494
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 2 > 211 - 219
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 756 - 766
2015 IEEE International Electron Devices Meeting (IEDM) > 9.1.1 - 9.1.4