Search results
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3964 - 3970
IEEE Electron Device Letters > 2016 > 37 > 8 > 1010 - 1013
IEEE Electron Device Letters > 2015 > 36 > 2 > 141 - 143
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2113 - 2118
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3206 - 3212
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 295 - 300
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1730 - 1737
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2173 - 2179
2011 International Reliability Physics Symposium > 2E.2.1 - 2E.2.8
2011 International Reliability Physics Symposium > 2E.3.1 - 2E.3.5
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1570 - 1574
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1748 - 1751
IEEE Electron Device Letters > 2011 > 32 > 3 > 321 - 323
IEEE Electron Device Letters > 2011 > 32 > 5 > 650 - 652
IEEE Electron Device Letters > 2011 > 32 > 7 > 907 - 909
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 3034 - 3041
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3501 - 3505