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IEEE Electron Device Letters > 2018 > 39 > 1 > 147 - 150
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 31 - 37
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 19 - 22
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5081 - 5086
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5284 - 5287
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5263 - 5269
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5274 - 5278
IEEE Electron Device Letters > 2017 > 38 > 12 > 1657 - 1660
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4910 - 4918
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4457 - 4465
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4607 - 4614
IEEE Micro > 2017 > 37 > 6 > 20 - 29
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 11 > 1897 - 1910
IEEE Electron Device Letters > 2017 > 38 > 10 > 1492 - 1495
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4193 - 4199