Search results
2015 IEEE International Reliability Physics Symposium > CD.2.1 - CD.2.5
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 339 - 345
IEEE Electron Device Letters > 2013 > 34 > 11 > 1373 - 1375
IEEE Electron Device Letters > 2013 > 34 > 3 > 366 - 368
IEEE Electron Device Letters > 2013 > 34 > 3 > 357 - 359
IEEE Electron Device Letters > 2012 > 33 > 5 > 667 - 669
IEEE Electron Device Letters > 2011 > 32 > 10 > 1370 - 1372
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1371 - 1376
IEEE Transactions on Electron Devices > 2007 > 54 > 8 > 1825 - 1830