Wyniki wyszukiwania
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 362 - 369
2012 International Electron Devices Meeting > 9.4.1 - 9.4.4
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2078 - 2084
IEEE Journal of Solid-State Circuits > 2012 > 47 > 1 > 151 - 163
2011 International Reliability Physics Symposium > 6B.3.1 - 6B.3.5
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2944 - 2951
2010 International Electron Devices Meeting > 27.5.1 - 27.5.4