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IEEE Journal of Solid-State Circuits > 2018 > 53 > 1 > 155 - 163
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 12 > 1417 - 1421
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4946 - 4951
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 12 > 3115 - 3125
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 11 > 2920 - 2933
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 10 > 2726 - 2736
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 9 > 2274 - 2283
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 8 > 2026 - 2035
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 7 > 2007 - 2016
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 5 > 565 - 569
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 2 > 310 - 321
IEEE Electron Device Letters > 2016 > 37 > 11 > 1438 - 1441
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 290 - 297
IEEE Transactions on Power Delivery > 2016 > 31 > 4 > 1447 - 1455
IEEE Journal of Solid-State Circuits > 2016 > 51 > 8 > 1785 - 1796
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2749 - 2756
IEEE Journal of Solid-State Circuits > 2016 > 51 > 7 > 1651 - 1662
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 4 > 1421 - 1429
IEEE Electron Device Letters > 2016 > 37 > 4 > 422 - 425