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IEEE Design & Test > 2016 > 33 > 3 > 21 - 36
2016 IEEE International Reliability Physics Symposium (IRPS) > 2B-2-1 - 2B-2-6
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2014 > 4 > 8 > 1284 - 1292
IEEE Electron Device Letters > 2011 > 32 > 4 > 563 - 565
SPEEDAM 2010 > 556 - 561
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1529 - 1532
2008 IEEE Custom Integrated Circuits Conference > 285 - 288