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IEEE Transactions on Power Electronics > 2017 > 32 > 1 > 503 - 514
IEEE Transactions on Reliability > 2016 > 65 > 4 > 1755 - 1768
2016 IEEE International Electron Devices Meeting (IEDM) > 34.5.1 - 34.5.4
2008 IEEE Custom Integrated Circuits Conference > 265 - 272