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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 381 - 398
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 404 - 413
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 307 - 315
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 2 > 143 - 154
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2038 - 2046
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 52 - 58
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 5068 - 5071
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 12 > 2200 - 2208
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 11 > 1848 - 1861
Journal of Display Technology > 2016 > 12 > 11 > 1238 - 1241
IEEE Transactions on Power Delivery > 2016 > 31 > 5 > 2206 - 2214
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 9 > 1308 - 1316
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 2987 - 2993
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2643 - 2649
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2764 - 2770
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 7 > 1105 - 1113
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2384 - 2390
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2517 - 2523
IEEE Transactions on Power Electronics > 2016 > 31 > 5 > 3482 - 3494