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IEEE Electron Device Letters > 2018 > 39 > 1 > 27 - 30
IEEE Journal of Solid-State Circuits > 2017 > 52 > 12 > 3312 - 3328
IEEE Transactions on Magnetics > 2017 > 53 > 11 > 1 - 4
IEEE Electron Device Letters > 2017 > 38 > 10 > 1375 - 1378
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4084 - 4090
IEEE Transactions on Magnetics > 2017 > 53 > 10 > 1 - 13
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 10 > 3910 - 3921
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 10 > 1162 - 1166
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 9 > 2237 - 2249
IEEE Electron Device Letters > 2017 > 38 > 9 > 1339 - 1342
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 3 > 236 - 242
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 7 > 762 - 766
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2842 - 2848
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 3037 - 3040
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 7 > 2164 - 2173
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 7 > 1740 - 1747
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 7 > 1706 - 1717
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 6 > 1018 - 1029
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2526 - 2532
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2770 - 2772