Search results
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-2-1 - DI-2-5
2013 IEEE International Reliability Physics Symposium (IRPS) > 3B.1.1 - 3B.1.6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 290 - 294
IEEE Transactions on Electron Devices > 2010 > 57 > 11 > 2907 - 2916
IEEE Electron Device Letters > 2010 > 31 > 2 > 165 - 167
IEEE Transactions on Electron Devices > 2010 > 57 > 4 > 795 - 803
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 62 - 70
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 287 - 294
IEEE Electron Device Letters > 2009 > 30 > 11 > 1185 - 1187
IEEE Electron Device Letters > 2009 > 30 > 10 > 1021 - 1023
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351