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Electronics Letters > 2017 > 53 > 23 > 1539 - 1540
2011 International Reliability Physics Symposium > CD.2.1 - CD.2.5
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 227 - 235
IEEE Transactions on Electron Devices > 2010 > 57 > 11 > 2907 - 2916
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 360 - 365
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 287 - 294
IEEE Electron Device Letters > 2009 > 30 > 10 > 1021 - 1023
IEEE Microwave Magazine > 2009 > 10 > 4 > 116 - 127