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2011 International Reliability Physics Symposium > MY.7.1 - MY.7.4
IEEE Electron Device Letters > 2011 > 32 > 6 > 710 - 712
IEEE Electron Device Letters > 2011 > 32 > 6 > 719 - 721
2010 International Electron Devices Meeting > 19.1.1 - 19.1.4
Proceedings of the IEEE > 2010 > 98 > 12 > 2185 - 2200