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IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 539 - 547
2009 IEEE International Reliability Physics Symposium > 1011 - 1013
IEEE Journal of Solid-State Circuits > 2008 > 43 > 4 > 946 - 955
IEEE Journal of Solid-State Circuits > 2007 > 42 > 11 > 2585 - 2593
IEEE Electron Device Letters > 2000 > 21 > 1 > 21 - 23