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2016 IEEE International Electron Devices Meeting (IEDM) > 17.7.1 - 17.7.4
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
IEEE Electron Device Letters > 2011 > 32 > 3 > 267 - 269
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 4 - 10
2010 International Electron Devices Meeting > 11.1.1 - 11.1.4
2010 International Electron Devices Meeting > 35.4.1 - 35.4.4
2010 International Electron Devices Meeting > 34.3.1 - 34.3.4
2010 International Electron Devices Meeting > 34.2.1 - 34.2.4
IEEE Electron Device Letters > 2010 > 31 > 10 > 1074 - 1076
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1924 - 1932
IEEE Transactions on Electron Devices > 2010 > 57 > 7 > 1706 - 1709
2009 International Semiconductor Conference > 1 > 3 - 12