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IEEE Transactions on Industrial Electronics > 2018 > 65 > 3 > 1955 - 1964
IEEE Transactions on Information Forensics and Security > 2018 > 13 > 1 > 79 - 93
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-2 > 5203 - 5211
IEEE Electron Device Letters > 2017 > 38 > 11 > 1547 - 1550
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 11 > 2934 - 2944
IEEE Design & Test > 2017 > 34 > 5 > 90 - 96
IEEE Transactions on Industrial Electronics > 2017 > 64 > 10 > 8364 - 8372
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 10 > 1716 - 1724
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 9 > 1483 - 1496
IEEE Power Electronics Magazine > 2017 > 4 > 3 > 33 - 40
IEEE Electron Device Letters > 2017 > 38 > 9 > 1282 - 1285
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 593 - 595