Search results for: L. E. Seixas
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 593 - 595
Journal of Electronic Testing > 2017 > 33 > 2 > 267-274
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 593 - 595
Journal of Electronic Testing > 2017 > 33 > 2 > 267-274