Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 67 - 70
IEEE Transactions on Industry Applications > 2017 > 53 > 3-1 > 2350 - 2357
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-8-1 - DI-8-5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 12 > 3076 - 3084
IEEE Transactions on Power Electronics > 2014 > 29 > 12 > 6555 - 6568
Canadian Journal of Electrical and Computer Engineering > 2013 > 36 > 4 > 181 - 187
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 236 - 250