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IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 191 - 198
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 322 - 330
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 215 - 222
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 339 - 346
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 780 - 784
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5217 - 5222
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4904 - 4909
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5256 - 5262
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4752 - 4758
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4575 - 4580
IEEE Electron Device Letters > 2017 > 38 > 11 > 1571 - 1574
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4568 - 4574