Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 111 - 114
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5099 - 5106
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 5 > 3138 - 3143
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3077 - 3083
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3337 - 3345
IEEE Electron Device Letters > 2017 > 38 > 7 > 867 - 870
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 349 - 354
IEEE Transactions on Plasma Science > 2017 > 45 > 4-2 > 749 - 753
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1412 - 1417
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 824 - 831
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 245 - 252
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 1 > 583 - 591
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 164 - 169