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Enabling a high-density ReRAM product requires: developing a cell that meets a stringent bit error rate, BER, at low program current, integrating the cell without material damage, and providing a high-drive selector at scaled nodes. We discuss ReRAM performance under these constraints and present a 16Gb, 27nm ReRAM capable of 105 cycles with BER < 7×10−5.
Implanting fluorine in pMOST devices was used to reduce their susceptibility to NBTI. The exact process step at which this implant is performed, determines the effectiveness of this reduction. This article presents the results of several experiments that were conducted in implanting fluorine.
Low frequency noise in virgin (not aged) graphene transistors might be relatively low (comparable to average Si MOSFETs), at least for high quality devices with the bottom gate configuration. Graphene channels are the dominant sources of noise, even though the contact resistances have an important effect on the noise magnitude due to the voltage re-distribution between the contacts and the channel...
The threshold voltage (VT) drift induced by negative bias temperature instability (NBTI) weakens PFETs, while positive bias temperature instability (PBTI) weakens NFETs fabricated with high-k metal-gate, respectively. These long-term VT drifts degrade SRAM cell stability, margin and performance, and may lead to functional failure over the life of usage. Additionally, most state-of-the-art SRAMs are...
The implementation of complex functionality in low-power nano-CMOS technologies leads to enhance susceptibility to parametric disturbances (environmental, and operation-dependent). The purpose of this paper is to present recent improvements on a methodology to exploit power-supply voltage and temperature variations in order to produce fault-tolerant structural solutions. First, the proposed methodology...
The objective of using logic BIST for online and periodic testing is to identify defects, like opens, resulting from the wear and tear of the circuit. We have shown that existing test sets have a low coverage for open defects located in scan flip-flops, even though such defects may affect functional operation. Existing Logic BIST structures suffer from the same limitations. A novel Logic BIST architecture...
A non-classical device structure namely self-aligned quasi-silicon-on-insulator (SOI) metal-oxide semiconductor (MOS) field-effect transistor with pi-shaped semiconductor conductive layer (SA-piFET) is presented, seeking to improve the performance and upgrade the reliability of the SOI-based devices. Designed to equip with a SA single crystal silicon channel layer, plus a natural source/drain (S/D)...
Current mode (CM) scheme provides suitable alternative for the high speed on-chip interconnect signaling. This paper presents a energy-delay optimization methodology for the current-mode (CM) signaling scheme. Optimization for the CM circuits for on-chip interconnects requires a joint optimization of driver and receiver device sizes, as their parameters which affect the energy-delay performance depend...
This paper presents an innovative structure based on 3 dimensional integration technology, where ultra thin inter layer dielectric enables a dynamic threshold voltage (VTH) control. A sequential process flow is proposed to fabricate 3D devices with dynamically tunable VTH. This ability can be exploited to design SRAMs cells with increased stability and surface density compared to planar technology...
Continuous scaling, necessary for enhanced performance and cost reduction, has pushed existing CMOS materials much closer to their intrinsic reliability limits, forcing reliability engineers to get a better understanding of circuit failure. This requires that designers will have to be very careful with phenomena such as high current densities or voltage overshoots. In addition to the reliability issues,...
Ultra Thin Body Si-On-ONO (UTB SOONO) transistors with ultra thin spacer are successfully demonstrated and evaluated. They have shown increased driving current more than 30% compared with conventional UTB SOONO transistors with thick spacer due to reduced source/drain resistance without short channel effect degradation by using thin spacer. In this paper, it is shown that thin spacer technology is...
The next generation of wireless communication is a ubiquitous radio system concept, providing wireless access from short-range to wide-area, with one single reconfigurable and adaptive system for all envisaged radio environments. This paper presents the design approach of RCO (reconfigurable concurrent oscillator) that simultaneously generates two or more signals of different frequencies that eliminate...
A high intercept points, cost-effective, and power-efficient switching FET double balanced mixer (DBM) is reported. The Switching FET DBM demonstrated in this work offers input intercept points (IIP3) and conversion loss typically 44 dBm and 8.5 dB respectively with 15 dBm LO power for the frequency band (RF: 900-2150 MHz, LO: 850-1950 MHz, IF: 50-200 MHz). The measured interport isolation is typically...
Hot-carrier (HC) degradation of analog operation parameters has been investigated by stressing LDD-n-MOSFETs with channel lengths of 1.0 - 5.0 ??m. A model has been developed to clarify the different mechanisms leading to degradation of the differential drain output resistance. Experimental evidence is given to check the model. Finally, possible consequences in the circuit environment are discussed.
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