Search results
Microelectronics Reliability > 2018 > 80 > C > 257-265
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-1.1 - 4B-1.5
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 218 - 225
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 282 - 289
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
Microelectronics Reliability > 2016 > 58 > C > 151-157
Microelectronics Reliability > 2016 > 58 > C > 177-184
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 756 - 766
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2423 - 2430
IEEE Electron Device Letters > 2015 > 36 > 10 > 1011 - 1014
2015 IEEE International Reliability Physics Symposium > 6C.3.1 - 6C.3.4
2014 IEEE International Reliability Physics Symposium > 6C.6.1 - 6C.6.7
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2199 - 2207