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2017 IEEE International Reliability Physics Symposium (IRPS) > 2A-3.1 - 2A-3.8
IEEE Electron Device Letters > 2016 > 37 > 11 > 1407 - 1410
IEEE Transactions on Semiconductor Manufacturing > 2016 > 29 > 4 > 384 - 389
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2469 - 2473
IEEE Transactions on Industrial Electronics > 2016 > 63 > 4 > 1995 - 2004
IEEE Electron Device Letters > 2015 > 36 > 7 > 720 - 722