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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Electron Device Letters > 2011 > 32 > 3 > 288 - 290
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2697 - 2703
IEEE Electron Device Letters > 2010 > 31 > 1 > 80 - 82
IEEE Transactions on Electron Devices > 2010 > 57 > 5 > 1129 - 1136
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 690 - 695
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3210 - 3217
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1548 - 1553
IEEE Transactions on Electron Devices > 2008 > 55 > 6 > 1494 - 1501
IEEE Electron Device Letters > 2007 > 28 > 11 > 957 - 959
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1338 - 1345
IEEE Transactions on Electron Devices > 2007 > 54 > 9 > 2445 - 2451
IEEE Journal of Solid-State Circuits > 2007 > 42 > 9 > 1842 - 1850