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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2478 - 2484
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4913 - 4918
2016 IEEE International Electron Devices Meeting (IEDM) > 31.5.1 - 31.5.4
IEEE Electron Device Letters > 2016 > 37 > 4 > 369 - 372
2016 IEEE International Reliability Physics Symposium (IRPS) > MY-7-1 - MY-7-5
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3222 - 3228
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3118 - 3124
2013 IEEE International Reliability Physics Symposium (IRPS) > 5D.4.1 - 5D.4.6
2011 International Reliability Physics Symposium > 3A.3.1 - 3A.3.6
2011 International Reliability Physics Symposium > 3A.2.1 - 3A.2.6
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Electron Device Letters > 2011 > 32 > 4 > 488 - 490
IEEE Electron Device Letters > 2011 > 32 > 5 > 605 - 607
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97