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IEEE Electron Device Letters > 2015 > 36 > 10 > 991 - 993
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1308 - 1321
IEEE Electron Device Letters > 2014 > 35 > 10 > 983 - 985
2012 IEEE International Reliability Physics Symposium (IRPS) > 2E.4.1 - 2E.4.6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
2009 International Semiconductor Conference > 1 > 93 - 96
2009 46th ACM/IEEE Design Automation Conference > 310 - 313
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1277 - 1283