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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 19 - 34
IEEE Journal of Solid-State Circuits > 2011 > 46 > 5 > 1100 - 1110
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 7 > 1860 - 1865
2009 31st EOS/ESD Symposium > 1 - 6