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2011 International Reliability Physics Symposium > 4C.1.1 - 4C.1.4
IEEE Electron Device Letters > 2008 > 29 > 10 > 1115 - 1117
2011 International Reliability Physics Symposium > 4C.1.1 - 4C.1.4
IEEE Electron Device Letters > 2008 > 29 > 10 > 1115 - 1117