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2011 International Reliability Physics Symposium > 2B.5.1 - 2B.5.5
IEEE Electron Device Letters > 2010 > 31 > 9 > 927 - 929
2011 International Reliability Physics Symposium > 2B.5.1 - 2B.5.5
IEEE Electron Device Letters > 2010 > 31 > 9 > 927 - 929