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2011 International Reliability Physics Symposium > CD.2.1 - CD.2.5
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 360 - 365
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 287 - 294
IEEE Microwave Magazine > 2009 > 10 > 4 > 116 - 127
IEEE Transactions on Electron Devices > 2008 > 55 > 7 > 1592 - 1602