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IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4393 - 4399
2016 IEEE International Electron Devices Meeting (IEDM) > 30.1.1 - 30.1.4
IEEE Transactions on Nuclear Science > 2016 > 63 > 2-3 > 1268 - 1275
2015 IEEE International Electron Devices Meeting (IEDM) > 20.3.1 - 20.3.4
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2745 - 2750
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 35 - 39
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 23 - 27
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 878 - 883
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 766 - 768
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1284 - 1291
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3663 - 3668
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1013 - 1022
IEEE Electron Device Letters > 2012 > 33 > 4 > 486 - 488
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
2011 International Reliability Physics Symposium > 5A.3.1 - 5A.3.5
2011 International Reliability Physics Symposium > 3F.2.1 - 3F.2.7