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2011 International Reliability Physics Symposium > 2A.3.1 - 2A.3.5
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 454 - 458
IEEE Electron Device Letters > 2009 > 30 > 7 > 760 - 762
IEEE Electron Device Letters > 2007 > 28 > 11 > 957 - 959
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2738 - 2749
IEEE Electron Device Letters > 2006 > 27 > 8 > 662 - 664