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IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1696 - 1701
IEEE Microwave and Wireless Components Letters > 2014 > 24 > 2 > 132 - 134
2013 IEEE International Electron Devices Meeting > 7.3.1 - 7.3.4
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.4.1 - MY.4.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 3B.5.1 - 3B.5.7
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2167 - 2172
2008 Congress on Image and Signal Processing > 1 > 174 - 183