Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2161 - 2165
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 239 - 244
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3084 - 3087
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1020 - 1026
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3470 - 3476
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1448 - 1455
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2332 - 2337
IEEE Electron Device Letters > 2014 > 35 > 4 > 440 - 442
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3550 - 3556
IEEE Transactions on Nuclear Science > 2013 > 60 > 1-2 > 402 - 407
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 524 - 533
IEEE Electron Device Letters > 2013 > 34 > 5 > 608 - 610
2012 International Electron Devices Meeting > 32.2.1 - 32.2.4
2012 International Electron Devices Meeting > 27.6.1 - 27.6.4
2012 International Electron Devices Meeting > 19.4.1 - 19.4.4
2012 International Electron Devices Meeting > 23.4.1 - 23.4.4
2012 International Electron Devices Meeting > 23.1.1 - 23.1.4